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Jeffery Aguiar


He is a staff scientist at Idaho National Laboratory (INL) and a recognized expert in materials characterization and instrumentation. He has a doctorate in materials science and condenser matter physics from the University of California, Davis. His work has spanned global and nationwide collaborations. He has worked at premier nanocharacterization facilities at national laboratories and universities and has expert knowledge of scanning transmission electron microscopy, atom probe tomography and electron loss spectroscopy. His primary research interests lie in the investigation of materials and the origins of their physical properties. He has heavily leveraged the use of multidimensional microscopy, diffraction and artificial intelligence to address delays in data access and extraction, which has led to a new frontier in advanced microscopy. At INL, he continues to focus on the development and application of machine and deep learning in order to decipher and decimate information from images, spectra, and diffraction patterns to maximize the effectiveness, efficiency and utility of advanced microscopy. He is an invited academic faculty member and manager for a diverse group of postdoctoral research scientists, graduate students, and technicians across several national laboratories and universities. He is an author of 45 peer-reviewed publications, a recognized reviewer, and a technical contributing member to energy materials research. He was awarded two patents and has three patents pending, including an innovative approach to computational microscopy using machine learning.